A latch is considered set when its output q is high, and reset when its output q is low. A latchup is a type of short circuit which can occur in an integrated circuit ic. Brief history on single event latchup susceptibility. Another solution is to put schottky diode clamps in the wires to prevent them from going more than 0.
In this chapter, a brief overview of latchup is provided. The structure of latchup in cmos circuits is traditionally represented by a lumpedelement model, which only consists of two parasitic bipolar transistors. Here is a typical bulk cmos device a simple inverter now, here is the same figure showing the parasitic bjts that cause latchup. Transientinduced latchup in cmos integrated circuits. Cmos chips between the power supply v dd and the ground gnd due to the interaction of parasitic pnp and npn bipolar junction transistors bjts these bjts form a silicon controlled rectifier scr with positive feedback and virtually short circuit v dd to the ground, thus causing excessive current flows and even. In some cases latchup can be a temporary condition that can be resolved by power cycle, but unfortunate. This effect often was observed in earlier generations of cmos circuits. By having a high conductivity path from vdd to gnd in the cmos structure, you could potentially damage the device and it would never recover. In the 1970s early work on cmos latchup was underway for space applications. May 04, 20 here is a typical bulk cmos device a simple inverter now, here is the same figure showing the parasitic bjts that cause latchup. Notice the two transistors, npn and pnp and their connection to vdd and gnd supply rails. Latchup is a particular problem in cmos caused by the physical structure of the manufacturing process. A problem unique to certain types of cmos logic gates is something called scr latchup. Latchup cause, effect and prevention allthingsvlsi.
Transientinduced latchup in cmos integrated circuits equips the practicing engineer with all the tools needed to address this regularly occurring problem while becoming more proficient at ic layout. I dont have enough parts with just the cmos chips, and i dont really feel like. Dependence of device structures on latchup immunity in a high. This is an abnormal condition capable of ruining a circuit, or at the very least causing operational problems in a circuit. The latch is responsive to s or r only if clk is high. Output scr structures a typical isocmos output driver contains one nchannel mosfet with its source tied to vss and one pchannel mosfet with its source tied to vdd. The new design with proposed solutions has been veri. Cmos logic circuits, d type latch analog devices wiki. Program, users manual, technology modeling associates, inc. It resulted in circuits either malfunctioning or consuming excessive power, and could be either inherent in the design or triggered by voltage spikes on io pads that could forward bias pn junctions they were connected to. Mechanisms and temperature dependence of single event latchup observed in a cmos readout integrated circuit from 16300 k cheryl j. This concern is becoming more widespread with the ascendency of cmos as the dominant vlsi technology, particularly as parasitic bipolar characteristics continue to improve at ever smaller dimensions on silicon wafers with ever lower defect densities. If both input signals and the clk signals are active high.
Latchup studies in bulk silicon cmos integrated circuits. Abnormal applications and misuse of cmos ics may still pose problems that the cmos vendor has little control over. Mechanisms and temperature dependence of single event. The proton latchup cross sections of these devices differed by. The avalanche breakdown mechanism described also applies directly to cmos devices, although its occurrence is far less prevelant.
Combining the trends of ss spacing, pwns spacing, and nwps spacing. Aug 15, 2007 i recently pulled out a couple old electronics learning kits of mine that came with cmos 4000 series logic chips. A thyristor has a feature called hysteresis which allows. Equivalent structure crosssection to explain core latchup scenario. Edn power management can cause latchup in cmos chips. Winning the battle against latchup in cmos analog switches.
These devices are normally in their off state and will remain off as long as the absolute maximum ratings of the devices are not exceeded. All the explanation images have 2 mosfets next to each other and the latchup comes from their interaction through the substrate. Ker and hsu introduce the phenomenon and basic physical mechanism of latchup, explaining the critical issues that have resurfaced for cmos. Early cmos processes suffered a reliability concern that became known as latchup. Evidence of the latchup domino effect is seen in that. We will provide a first quick look on what latchup is. In line with the io circuits, the core latchup problem in hv process technologies is solved by isolation of the core circuit from the substrate in a separate npocket with a proper nchannel stop ncs ring at the periphery of the pocket. Request pdf latchup complementary metaloxide semiconductor cmos latchup is a. Latchup in cmos design electrical engineering stack exchange. As a starting point, this discussion will be followed by. Latchup refers to short circuit formed between power and ground rails in an ic leading to high current and damage to the ic. Problem on complex cmos logic gates gate ece 2012 solved paper electron devices duration. Pdf latchup in integrated circuits from energetic protons. Figure 5 shows, in simplified form, the construction of a cmos circuit with additional diode paths.
Latchup has been, and continues to be, a potentially serious cmos reliability concern. We will stress the similarities and differences between the nmos depletionload logic and cmos logic circuits and point out the advantages of cmos gates with examples. Our goal is to combine parallel signal detection and parallel signal processing in one chip. Parasitic lateral pnp and vertical npn bjts in a pwell cmos technology. Allen 2016 latchup triggering latchup of the scr can be triggered by two. Simply defined, latchup is a functional chip failure associated with excessive current going through the chip, caused by weak circuit design. Series sampling the sh circuit of figure 1 is classified as parallel sampling because the hold capacitor is in parallel with the signal.
Vlsi design sequential mos logic circuits tutorialspoint. More specifically it is the inadvertent creation of a lowimpedance path between the power supply rails of a mosfet circuit, triggering a parasitic structure which disrupts proper functioning of the part, possibly even leading to its destruction due to overcurrent. Improve latchup immunity by circuit solution huiwen tsai and mingdou ker institute of electronics, national chiaotung university, hsinchu, taiwan abstract a concept of active guard ring and its corresponding circuit solution to enhance the latchup immunity of integrated circuits ic are proposed and verified in a 0. The individual bipolar devices have low current gain, with a. The behavior of cmos devices when the supply voltage is switched off is essentially determined by the protective circuits at the inputs and outputs. The objective of this lab activity is to reinforce the basic principles of cmos logic from the previous lab activity titled build cmos logic functions using cd4007 array and gain additional experience with complex cmos gates. In its most general form, a combinational logic circuit, or gate, performing a boolean function can be represented as a multipleinput, singleoutput system, as depicted in the. The transient analysis of latchup in cmos transmission gate. Slya014a latchup, esd, and other phenomena 5 the parasitic thyristor can be triggered by a rapid rise of the supply voltage.
Msan107 understanding and eliminating latchup in cmos. The formation of a single event latchup in a bulk cmos circuit is described. It is also theoretically possible to trigger parasitic scr. Vendors of cmos ics have always been aware of the latchup phenomenon and have considerably improved their designs and processes to reduce the danger of latchup occurring under normal usage. The two transistors are protected by resistors but if examined more closely, theres an scr device that could possibly be triggered. Aug 20, 2016 latchup is a particular problem in cmos caused by the physical structure of the manufacturing process. In line with the io circuits, the core latchup problem in hv process technologies is solved by isolation of the core circuit from the substrate in a separate npocket with a proper n. Mechanisms and temperature dependence of single event latchup.
In cmos fabrication, latchup is a malfunction which can occur as a result of improper design. Cmos and bicmos circuits use nmos and pmos transistors to create the circuit functions. The nmos and pmos circuits form parasitic pnpn structures that can be. Is it possible to have latchup in a single mosfet package. It resulted in circuits either malfunctioning or consuming excessive power, and could be either inherent in the design or triggered by voltage spikes on io pads that could forward bias pn. Excessive voltage on the power supply pins, whether continuous or transient, may result in latchup occurrence. Proton latchup was investigated for several cmos integrated circuits, including a modern microprocessor. In the design of the cmos integrated circuit, the proximity of the. Since joining adi in 2005, she has accumulated a wealth of experience in the industrial market. Having a consistent definition for set and reset is important, especially as students study multiple latch circuit topologies and activelow inputs. As already stated, latchup occurs as a result of triggering a parasitic devicein effect an. Feb 02, 2009 problem on complex cmos logic gates gate ece 2012 solved paper electron devices duration.
This lumpedelement model describes the most sensitive structure of the latchup, and can provide a simple picture of the latchup. Layout consideration and circuit solution to prevent eos. Speaking about cmos transistors, latch up is the phenomenon of low impedance path between power rail and ground rail due to interaction between parasitic pnp and npn transistors. First, however, know what a thyristor is aka an scr or silicon controlled rectifier. Cmos analog integrated circuits based on weak inversion. Figure 1 to prevent latchup in cmos chips you can put highvalue resistors between the inputs and outputs a. Sep 25, 2016 cmos latch construction using transistors and gates. In the early 1980s, cmos latchup and electrostatic discharge esd phenomenon of significant interest. Latchup continued the equivalent circuit shown has q1 being a vertical double emmitter pnp transistor whose base is formed by the nwell with a high base to collector current gain b 1.
Lecture 08 latchup and esd 42516 page 086 cmos analog circuit design p. Apr 18, 2018 equivalent structure crosssection to explain core latchup scenario. Q2 is a lateral double emitter npn transistor whose base is formed by the ptype substrate. Latchup, esd, and other phenomena 5 the parasitic thyristor can be triggered by a rapid rise of the supply voltage. Output scr structures a typical iso cmos output driver contains one nchannel mosfet with its source tied to vss and one pchannel mosfet with its source tied to vdd. I thought it might be cool to try to build a simple 4bit processor with the combined parts. Subscribe this channel for more videos on physical design fundamentals. Screenshot of many latchup test structures, labeled a through r, that are biased through the same four pads. The proton latchup cross sections of these devices differed by more than two orders of. Alternative cmos sampleandhold circuits this section covers three alternative cmos sh circuits that are developed with the intention to minimize charge injection andor clock feedthrough. These circuits are intended to protect the device from damage from electrostatic discharge esd. Research and development into the causes led to several papers in the 1980s discussing causes and methods to lessen the influence of latchup. There are two kinds of latchup in merged bicmos circuits. Ladbury1, augustyn waczynski1, rajan arora3, roger d.
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